Proceedings of Microelectronics Symposium
Online ISSN : 2434-396X
MES2017
Conference information

MES2017
Evaluation method for electronic contact between printed metal electrode-semiconductor: Design and fabrication of the electrode pattern from silver nano-ink for estimating contact resistivity on silicon wafer
*[in Japanese][in Japanese][in Japanese]
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Pages 99-102

Details
Article 1st page
Content from these authors
© 2017 The Japan Institute of Electronics Packaging
Previous article Next article
feedback
Top