1966 年 4 巻 6 号 p. 401-423
The structure of the 96R polytype of SiC was investigated with the use, of X-ray diffraction photographs. Taking advantage of the fact that the structure of every polytype of this material consists of identical layers, a direct method was deviced to determine the sequence only from semi-quantitative intensity data. The method was successfully applied, and the structure thus deduced is (3333333434)3 in the Zhdanov symbol.