[Invited Paper] High Precision Measurement of Twist Elastic Constant K22 of Liquid Crystal Materials using Ellipsometry Analysis

Takahiro Ishinabe; Yuzuka Morita; Yuji Ohno; Tetsuya Miyashita; Hideo Fujikake; Tatsuo Uchida

doi:10.3169/mta.2.52

Special Section on ITE Awards Selection

[Invited Paper] High Precision Measurement of Twist Elastic Constant K22 of Liquid Crystal Materials using Ellipsometry Analysis

Takahiro Ishinabe, Yuzuka Morita, Yuji Ohno, Tetsuya Miyashita, Hideo Fujikake, Tatsuo Uchida

著者情報

キーワード: Liquid crystal, Twisted nematic, Elastic constant measurement, K22, Ellipsometry analysis, Director profile simulation

ジャーナルフリー

2014 年 2 巻 1 号 p. 52-59

DOI https://doi.org/10.3169/mta.2.52

詳細

抄録

We proposed a simple and accurate method for measuring the twist elastic constant K22 of liquidcrystal materials. The novel technique is based on the ellipsometry analysis, and determines the director profile of a twisted nematic liquid crystal cell in the on state. We validated this experimentally, and showed that it is effective for evaluating the response characteristics of liquid crystal displays.

責任著者(Corresponding author)

J-STAGEへの登録はこちら（無料）