Journal of Network Polymer,Japan
Online ISSN : 2186-537X
Print ISSN : 1342-0577
ISSN-L : 1342-0577
Original
Structural Analysis of Nano-particles Dispersed in the Transparent Network Resin Using a Synchrotron X-ray Scattering
Kazunobu SenooKatsuhiko NakamaeWataru OkaYasuo ShimobeYoshimasa UrushiharaJunji MatsuiKatsuhiko NakamaeShigeo Kuwamoto
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2010 Volume 31 Issue 1 Pages 19-23

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Abstract

SynopsisIn addition to transparency, low thermal expansion and high heat resistance are required for the polymeric materials used in the field of photovoltaic cells and display substrates. We developed the transparent substrate having these properties by dispersing a higher content of colloidal silica into the resin.The plastic substrate having more than 90% of total light transmittances was obtained by immobilizing 33vol.% of silica particles of ca.110 nm diameter into this polymer network. A Bragg lattice spacing obtained from measurement of a synchrotron radiation small-angle X-ray scattering is correlated with the distance between silica particles observed in the scanning electron microscopic images. These results indicate that a synchrotron radiation is powerful tool for evaluation of dispersion of silica nano-particles in the network polymer.(Received November 16, 2009)

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© 2010 Japan Thermosetting Plastics Industry Association
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