Abstract
X-ray Photoelectron Spectroscopy (XPS), has been widely used to analyze both inorganic and organic material surfaces. Recently it has proved to give also geometrical information, such as crystalline structure or molecular orientation, besides conventional elemental and functional group analysis.
In this paper, problems in the measurement and analysis of polymer materials by XPS are briefly reviewed. Recent developments of small area XPS, gas chemical modification and analysis of molecular orientation which are being done in the authers' laboratory are also introduced.
More intensive collaboration between researchers in the relating fields of materials development, surface analysis and instrument design is necessary in order to fully utilize the potential of XPS.
