X線小角散乱によるGeO2ガラスの微細構造
1981 年 1981 巻 10 号 p. 1684-1685
詳細
1981 年 1981 巻 10 号 p. 1684-1685
Microstructure in the GeO2 glass was studied by calculating the small angle Xray scattering (SAXS) intensity. The net SAXS was obtained by subtracting the theoretically calculatted intensity, which is the skirt of hallow of Xray diffraction, from the observed intensity by Pierre et al. It has been shown that the size of heterogeneities in the GeO2 glass was calcu-l ated to be 1.9 nm from Guinier plot (Fig.2) of the net SAXS intensity. It has been considered that the heterogeneities were caused by the fluctuation of the frozenin density in the GeO2 glass.
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