Epitaxial Growth of Mn-Sb Multilayered Films

Abstract

The structure of Mn-Sb multilayerd films has beep investigated by transmission electron microscopy. Well oriented Sb buffer layers with thickness of 300Å are formed when they are deposited on non-crystalline triacetylcellulose films. When a Mn layer is deposited on the Sb buffer layer, an intermetallic compound MnSb is formed epitaxially on the Sb layer. The epitaxial growth was confirmed by electron diffraction patterns (Figs.3 and 4), X-ray diffraction, pattern (Fig.5) and bright field images (Figs.6 and 7).