Oleoscience
Online ISSN : 2187-3461
Print ISSN : 1345-8949
ISSN-L : 1345-8949
Precise Structural Analysis of Molecular Layer at Soft Interface II : X-ray Reflectometry
Hideki MATSUOKA
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2012 Volume 12 Issue 1 Pages 17-23

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Abstract
X-ray reflectometry is very useful technique for in situ nanostructure analysis of surfaces and interfaces with very high accuracy. Its principle and application to monolayer of ionic amphiphilic diblock copolymer at the air/water interface are described. Especially, information on the nanostructure and its transition of polyelectrolyte brush under the water could be quantitatively obtained. As a result, the differences of brush formation mechanism and response to added salt were clarified.
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© 2012 Japan Oil Chemists' Society
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