Abstract
Infrared spectroscopy is one of the most useful analytical tools to study molecular architecture and surface properties of thin films comprised of softmaterials. Thus far, however, the infrared spectroscopy has mainly been used for discussion of limited purposes such as investigations of semi-quantitative molecular orientation and of the state of hydrogen bonding formed in the film. In this manuscript, recent progress of infrared spectroscopy for studying thin softmaterials is presented, which is expected to have great potential to reveal new characteristics of the materials.