Analysis of Digital Lateral Shearing Interferometer

Haike GUAN; Shigeharu YOSHIKAWA; Masahiro YAMAGUCHI; Nagaaki OHYAMA

doi:10.1007/s10043-995-0471-6

Haike GUAN, Shigeharu YOSHIKAWA, Masahiro YAMAGUCHI, Nagaaki OHYAMA

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Keywords: lateral shearing interferometer, discrete sampling, wavefront reconstruction, phase difference, system error, shear amount, sampling interval

JOURNAL FREE ACCESS

1995 Volume 2 Issue 6 Pages 471-475

DOI https://doi.org/10.1007/s10043-995-0471-6

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Abstract

A new method is proposed for reconstructing wavefront from discretely sampled interferogram data obtained by a digital lateral shearing interferometer. Assumptions applied in the conventional methods are not used and reconstruction error caused by the difference between the amount of shear and the sampling interval can be removed. System error and the influence of the discrete sampling, which limit accuracy of the tested results of the lateral shearing interferometer, are analyzed.

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