High-Resolution Reflectometry by Optical Multidigitized Coherence

Tsutomu ICHIMURA; Naoki ANNDO; Tadayuki FUNABA; Shigeru ENDO; Yoshiki ODAGIRI; Naohiro TAN–NO; Humio INABA

doi:10.1007/s10043-996-0038-1

Tsutomu ICHIMURA, Naoki ANNDO, Tadayuki FUNABA, Shigeru ENDO, Yoshiki ODAGIRI, Naohiro TAN–NO, Humio INABA

Author information

Tsutomu ICHIMURA
Department of Electronics and Information Engineering Yamagata University, Yonezawa, 992 Japan
Naoki ANNDO
Department of Electronics and Information Engineering Yamagata University, Yonezawa, 992 Japan
Tadayuki FUNABA
Department of Electronics and Information Engineering Yamagata University, Yonezawa, 992 Japan
Shigeru ENDO
Department of Electronics and Information Engineering Yamagata University, Yonezawa, 992 Japan
Yoshiki ODAGIRI
Department of Electronics and Information Engineering Yamagata University, Yonezawa, 992 Japan
Naohiro TAN–NO
Department of Electronics and Information Engineering Yamagata University, Yonezawa, 992 Japan
Humio INABA
Department of Electronics, Tohoku Institute of Technology, 35–1 Yagiyama–kasumichou, Taihaku–ku, Sendai, 982 Japan and Biophotonics Information Laboratories, 683 Kurumanomae, Ohaza Numagi, Yamagata, 990 Japan

Keywords: optical frequency domain reflectometer, multi mode laser, optical signal processing, optical interference meaurements, laser coherence

JOURNAL FREE ACCESS

1996 Volume 3 Issue 1 Pages 38-46

DOI https://doi.org/10.1007/s10043-996-0038-1

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Abstract

We propose and confirm a novel technique of optical frequency domain reflectometry based on multidigitized coherence using a multimode laser. The proposed system can easily provide the potential for high resolution on the order of 10 μm without scanning frequencies as in frequency domain reflectometers of either continuous or stepwise sweep. The theoretical approach agrees well with the experimental results demonstrated using a commercially available multimode laser diode.

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