Numerical Method to Fit the Refractive Index Profile of Planar Microlenses Made by Ion Exchange Techniques

Eva ACOSTA; Susana RÍOS; Masahiro OIKAWA; Akimitsu SATO; Kenichi IGA

doi:10.1007/s10043-996-0227-y

Eva ACOSTA, Susana RÍOS, Masahiro OIKAWA, Akimitsu SATO, Kenichi IGA

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Keywords: planar microlenses, 3-D distributed index profile, shearing interferometry, ion exchange techniques

JOURNAL FREE ACCESS

1996 Volume 3 Issue 4 Pages 227-231

DOI https://doi.org/10.1007/s10043-996-0227-y

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Abstract

We present a fitting method for obtaining a functional form of the refractive index profile of planar microlenses made by ion exchange techniques from total shearing interferometric measurements. Compared to the usual power series expansion fit, this method allows a reduction in the number of coefficients needed to characterize a lens.

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