2004 Volume 73 Issue 6 Pages 754-758
X-ray fluorescence (XRF) imaging is a technique of analyzing the spatial distribution of elements.In these years, scanning-type XRF imaging with a synchrotron submicron beam has been widely used as a strong scientific tool in material research as well as environmental and life sciences.Recently, a novel method, projection-type imaging, has been proposed.The advantage of this method is the capability of obtaining an image with large pixel numbers in a very short exposure time, because one can take an image by only one shot without any scans.Now XRF movie imaging becomes available for element mapping, although only still images have been obtained so far.Furthermore, the method can be highlighted due to its ability of advanced imaging of atomic-scale structure and chemical states by extending to X-ray absorption fine structure (XAFS) and X-ray diffraction (XRD) imaging.
