2008 Volume 77 Issue 3 Pages 296-300
Using c-axis-oriented single-crystalline ZnO/Zn1-xMgxO heterostructures grown on a-plane sapphire substrates by molecular beam epitaxy, the formation of a two-dimensional electron gas (2DEG) with high electron mobility at the heterointerface is analyzed. The 2DEG was found to be accumulated by an internal electric field induced predominantly by the difference in spontaneous polarization between the two adjacent oxides. We applied the 2DEG to a top-gate field-effect transistor with an amine-modified Zn1-xMgxO gate insulation layer, and demonstrated an amperometric operation in an ion-sensitive device suitable for biosensing applications.