Oyo Buturi
Online ISSN : 2188-2290
Print ISSN : 0369-8009
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Novel SIMS techniques for organic and biological materials with high-density excited primary ion beams
Jiro MATSUO
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JOURNAL FREE ACCESS

2010 Volume 79 Issue 4 Pages 326-330

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Abstract

The recent progress of organic SIMS with new primary ion beams is overviewed. Both the molecular depth profiling of an organic multilayer and high-resolution molecular imaging have been demonstrated using cluster ions or swift heavy ions, which provide high density excitation on surfaces. These new SIMS techniques lead to advances in new functional polymer synthesis, molecular electronics, biological materials and life science.

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© 2010 The Japan Society of Applied Physics
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