In situ investigation of oxide thin film growth using scanning tunneling microscopy

Abstract

In recent years, the functional oxide thin films and their heterostructures have demonstrated a range of surprising properties. Here, we present insights into the atom-by-atom growth of oxide thin films, and further reveal the unique electronic properties on the SrTiO₃ surface. Given the wide range of compositions these oxides can span, it is expected that more functionalities can be discovered through the atomic-scale in situ investigation of surfaces and growths using high-resolution scanning tunneling microscopy/spectroscopy (STM/STS).