Abstract
After effects in GM counters of organic and halogen quenched types were studied by the use of low energy X-ray bursts from a pulsed X-ray generator. From the experimental results, it is shown that the probability of an after pulse occuring in the irradiation of low energy X-ray bursts is much smaller than that obtained with_??_1 MeV X-ray bursts. It was found that after pulses are not associated directly with the main pulse, and the probability of their appea-rance depends on the intensity of the X-ray burst and the position of the irradiation. Especially when the vicinity of the cathode was irradiated, a considerable increase in the number of after pulses was observed. As for the time distribution of after pulses, the experimental results were similar to those obtained with_??_1 MeV X-ray bursts.
