話題
加速器を用いた半導体デバイスへの放射線照射試験
2016 年 12 巻 4 号 p. 222-225
詳細
2016 年 12 巻 4 号 p. 222-225
Accelerators and their uses for single event effects testing of semiconductor devices in Japan are showed. Single event effects are malfunctions induced by heavy ions incidence to the semiconductor devises. For increase single event effects tolerance of semiconductor devices, accelerator testing is required.
