Abstract
The purpose of this work is to prepare epitaxial (Ni, Zn)Fe2O4 (NZF) ferrite thin films having high squreness (Mr/Ms) by optimization of buffer layer ((MgO-Al2O3)/CeO2/YSZ). The orientation of NZF thin films were controlled by the content of Al2O3 addition. It was clarified that high squreness was realized for (111)-oriented epitaxial NZF thin film if the content of Al2O3 was around 40 mol%.