Abstract
A series of rare-earth silicon-oxynitride J-phases, Ln4Si2O7N2 (Ln = rare earth) has been prepared by the N2 gas-pressure sintering method under 1 MPa of N2 at 1973-2173 K. The cell parameters of the J-phases have been refined by Rietveld analysis for X-ray powder diffraction data measured at room temperature. A group of Ln4Si2O7N2 with Ln = La, Pr, Nd, and Sm possesses the high-temperature Y4Al2O9 structure and other group with Ln = Y and Gd-Lu has the low-temperature Y4Al2O9 structure. The cell parameters of the J-phases in each Ln group increase linearly with increasing ionic radii of rare-earth elements. Discontinuities of the cell parameters have been found between the two Ln groups.