Development of a next-generation pattern-fitting system RIETAN-FP and its integrated assistance environment

Abstract

We developed RIETAN-FP and VESTA, which are, respectively, successors to a multi-purpose pattern-fitting system RIETAN-FP and VICS/VEND for three-dimensional visualization. Further, we build an integrated GUI environment to assist structure analysis using RIETAN-FP, VESTA, a MEM analysis program PRIMA, ALBA for the maximum-entropy Patterson method, and an ab initio structure analysis system EXPO2004, etc.