Back-Surface Temperature Measurements of Thin Tungsten Materials during Plasma-Gun Generated Pulsed Plasma Irradiation using a Fast Two-Color Pyrometer

抄録

A fast two-color pyrometer system was developed to measure the back-surface temperature of thin tungsten materials during plasma-gun generated edge localized mode-like pulsed plasma irradiation. The developed pyrometer system had a time resolution of ∼5 µs and the lowest measureable temperature was ∼1600 K. We observed that the back-surface temperature of the thin tungsten material during the pulsed plasma irradiation reached ∼3280 K. The absorbed energy density and the pulse width of the pulsed heat load estimated by the measured time evolution of the back-surface temperature and 3D heat analyses using ANSYS code were ∼0.52 MJm⁻² and ∼1.6 ms, respectively.