Evaluation of Edge Electron Temperature Fluctuation by the Use of Fast Voltage Scanning Method on TST-2

抄録

Edge electron temperature fluctuation is evaluated by the use of fast voltage sweeping technique on TST-2. The validity of obtained current-voltage characteristic curve was checked by comparing the time evolutions of floating potential between that obtained from the fast voltage sweeping technique and that measured with floating probe method. Good agreement between them was confirmed. We also found that fitting errors in the evaluation of the electron temperature itself are less than 10% of fluctuation levels of the electron temperature. Therefore the accuracy of the technique is applicable to study of plasma fluctuations.