抄録
In order to evaluate tungsten (W) coating performance, thin W film was deposited onto reduced activation ferritic/martensitic steel (F82H) by using rf magnetron sputtering device, then was irradiated at room temperature by 1.7keV D+ ions. After the irradiation, the deuterium retention of the coated sample (W/F82H) was evaluated by thermal desorption spectroscopy (TDS) and compared with those of the F82H and pure W. During TDS measurements, D2 was desorbed in all materials but HD was only found in significant amount in W/F82H and related to the increase of effective surface area due to the porous film structure. D retention increased with increasing fluence and was accompanied by growth of circular blisters. The size of blisters was limited by the F82H substrate structure.
