Efficient estimation for red-zone in silicon wafers for solar cells using Level Set Estimation

Abstract

For the task of estimating a spacial distribution of a physical quantity, it is common to x the measurement positions to meshgrid points evenly allocated along the coordinates of the space. However, such xed measurement positions often contain redundancy in the sense that not all the measurements in the meshgrid points are required for the target task. Especially when a measurement of the physical quantity is costly, it is thus benecial to allocate the measurement points adaptively and reduce the number of measurements. In this study, we applied Level Set Estimation (LSE), which is a method to efficiently estimate the boundary position, to carrier lifetime mapping of silicon for solar cells, and estimated the low quality region. Our approach can reasonably estimate the boundary position by measuring less than 1% position compare to conventional approach.