Host: The Japanese Society for Artificial Intelligence
Name : The 37th Annual Conference of the Japanese Society for Artificial Intelligence
Number : 37
Location : [in Japanese]
Date : June 06, 2023 - June 09, 2023
Supervised learning typically requires a large amount of data, and the cost of labeling can be significant if obtaining labels is difficult. This is also true when evaluating a model. Active testing is introduced to address this challenge by estimating the average test loss through actively labeling a portion of test data. However, in practical machine learning, multiple good model candidates are often available instead of just one. The problem of interest then becomes selecting the best performing model. In this study, we propose a method to compare the performance of multiple models with a small amount of labeling by extending the framework of active testing.