The benefits of wide-range imaging by electron microscopy

Abstract

Electron microscopes have a significantly narrower field of view than optical microscopes. To overcome this limitation, an automatic tiling and image merging method has been developed, which enables to obtain wide-range high-resolution images. Wide-range imaging of sections can be performed with either transmission electron microscopy (TEM) or scanning electron microscopy (SEM). The wide-range TEM is recommended if high magnification is desired, while the wide-range SEM is recommended if simplicity and three-dimensional construction are desired. Nowadays, it is possible to automatically acquire wide-range, three-dimensional images, and big data images are readily available. In this paper, I discuss the benefits of wide-range imaging by electron microscopy and its applications, showing actual wide-range images.