抄録
Europium ions are used as indicators for defect center formation under X-ray and UV irradiation in a fluoride phosphate and an ultraphosphate glass melted in air and under reducing conditions. Absorption and electron spin resonance spectroscopy is used to determine both intrinsic defect center formation and radiation-induced valence changes of europium ions. The effect of the europium ions on the defect center formation is studied in dependence on glass composition, melting condition and radiation source.
