Proceedings of IIAE Annual Conference
Online ISSN : 2424-211X
2024
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Non-destructive inspection of defects fabricated in a solar cell-film by using the combination method of Lock-in Thermography and Digital Holography
*Taisei Fukushima*Taisei Kishikawa*Varun Kumar*Masayuki Yokota
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CONFERENCE PROCEEDINGS OPEN ACCESS

Pages 83-84

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[in Japanese]
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© 2024 The Institute of Industrial Applications Engineers
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