3D Profile Measurement by Color Pattern Projection- (2nd report) Using of Color and Matching Process -

Abstract

A new color structured lighting for 3D profile measurement by projecting a pattern of color stripes will be presented. The problem of finding the correct color stripe correspondence between light source and images is solved by accurately calibrating the system parameters. A technique for projector & camera calibration using calibration points that projected from projector is presented. Stripe pattern information are extracted from the acquired images and then used for finding the correct projected-observed stripe match. After matched stripes information was obtained, 3D profile is reconstructed by means of triangulation.