Proceedings of JSPE Semestrial Meeting
2005 JSPE Autumn Meeting
Session ID : D08
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Development of Ultra-precision ELID/MRF Complex Fabrication Process
*Shaohui YinWeimin LinHitoshi OhmoriYoshihiro UeharaMuneaki AsamiQing LiuToru SuzukiYutaka WatanabeShinya Morita
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Abstract
Magneto –rheological Finishing (MRF) was applied to nano–precision finishing of silicon wafer. Several sets of finishing experiments for silicon wafer have been performed to verify obtainable surface roughness and removal rate. Influence of some process parameters such as wheel rotation, magnetizing current, immersed depth and MR fluids viscosity on removal rate were investigated. The surface micro–roughness less than 10 Angstrom for silicon mirror were produced.
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© 2005 The Japan Society for Precision Engineering
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