A super-resolution microscopy technique with standing evanescent light

Abstract

A super–resolution microscopy technique with standing evanescent light in TIR (Total Internal Reflection) has been proposed that resolves samples on the interface in a lateral resolution of better than the diffraction limit. Samples are illuminated with standing evanescent light shifted in different positions, and the sample distribution is calculated from acquired scattering images in the use of ART (Algebraic Reconstruction Technique). This technique improves the lateral resolution up to about 1/7 of the diffraction limit.