Proceedings of JSPE Semestrial Meeting
2011 JSPE Spring Conference
Session ID : O45
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Host: The Japan Society for Precision Engineering

High resolution and high speed in-plane deformation measurement using sub-sampling method in ESPI
*Yasuhiko Arai, Shinpei Toyotome, Shunsuke Yokozeki
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Keywords: applied optics measurement, speckle interferometry, sub-sampling method
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[in Japanese]
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© 2011 The Japan Society for Precision Engineering
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