Proceedings of JSPE Semestrial Meeting
2011 JSPE Spring Conference
Session ID : D35
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CMP technique for copper surface finishing using water-soluble fullerenol (3rd report)
Investigation of the polishing performance of patterned wafers
*Hirotaka KishidaYasuhiro TakayaTerutake HayashiMasaki MichihataKen Kokubo
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CONFERENCE PROCEEDINGS FREE ACCESS

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[in Japanese]
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© 2011 The Japan Society for Precision Engineering
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