Proceedings of JSPE Semestrial Meeting
2011 JSPE Spring Conference
Session ID : K16
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Thermal signal dependence on the probe height in the passive THz near-field microscope
*Yusuke KajiharaKeishi KosakaSusumu Komiyama
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Abstract
Our passive THz near-field microscope probes thermally excited surface waves with nanoscale resolution from room temperature object. When a probe is separated from the sample surface, near-field components decay within several 10 nm, whereas standing wave components occur at a height of more than 1 μm. This finding is interesting because our microscope does not use any external coherent source. Here we report theoretical and experimental analyses of localized near-field components and the standing wave components.
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© 2011 The Japan Society for Precision Engineering
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