A new probe positioning method for the passive THz-SNOM

Abstract

Our passive THz-SNOM (Scanning Near-field Optical Microscope) probes spontaneous evanescent waves with 60 nm resolution without external illumination. In this THz-SNOM, we use a little metal mark for probe positioning. We expect that using the local temperature change induced by a LASER spot as a mark enable to measure other various samples like biocells. Here We report a fundamental verification.