Verification of Polishing Phenomena of Al5052/Al(99+) using Photocatalyst and Fluorescent Substance Excited by Ultraviolet Ray

Study of Ultraviolet-Ray Aided Machining (U-RAM)-(14th Report)

Abstract

We have tried to process the materials by applying the deoxidization/oxidization reaction of electron and hole provided by irradiating an ultraviolet ray on photocatalyst and fluorescent substance, and the mechanical scratching action of photocatalyst. Where Al5052 was polished using these phenomena under various conditions, the following results were obtained; the surface roughness did not decrease when TiO2 was only used, rich fluorescent substance roughened surface by promoting chemical reaction, and 0.1μm-TiO2 provided the surface roughening by chemical erosion. The processing conditions were clarified for establishing the smallest roughness of workpiece. Very smooth surface of about 10nmRa for larger flat-surface was obtained using these polishing conditions for Al(99+).