2014 JSPE Spring Conference
Session ID : F36
Conference information
Host: The Japan Society for Precision Engineering
Development of Simultaneous Multi-Site Ion Conductance Microscopy Integrated with Nanoneedle Array for Cell Morphology Imaging (2nd report)
Fabrication of in-plane type follow nanoneedle array
Keywords:
SICM,
Three-dimensional geometry,
Imaging,
Ion conductance,
Comb denture mold electrode,
Scanning probe
Details
