Proceedings of JSPE Semestrial Meeting
2018 JSPE Spring Conference
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Investigation of the effect of grain size variation on ground wafer surface by grinding experiment/simulation
Yutaro EbinaTomohiro Maezaki*Libo ZhouJun ShimizuTeppei OnukiHirotaka OjimaMasatomo Inui
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 85-86

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[in Japanese]
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© 2018 The Japan Society for Precision Engineering
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