Proceedings of JSPE Semestrial Meeting
2021 JSPE Autumn Conference
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Measurement of real contact area under hertzian contact using sputtered thin film
*Tomoaki KuboTakahisa KawaguchiYoshimasa Takayama
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Pages 602-603

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Abstract

In this study, a technique is proposed to realize the detection of the micro-contacts. The technique for detecting the contacts is based on the principle using transfers between sputtered thin films coated on both of contact surfaces. The micro-contacts between both surfaces of a rough steel ball and a smooth glass flat are observed and measured, using the proposed technique. After indentation, surface images of contacts were measured on the glass surface by an optical microscope and SPM. The result showed that it is found that the obtained results of contact circle become larger than hertzian contact.

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© 2021 The Japan Society for Precision Engineering
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