Host: The Japan Society for Precision Engineering
Name : 2024 JSPE Spring Conference
Location : [in Japanese]
Date : March 12, 2024 - March 14, 2024
Pages 329-330
Although it is possible to measure the height of nano-particles near the surface using multi-wavelength evanescent light optical system, conventional optical system can only observe two wavelengths using such as dichroic mirrors. Using an optical system that is not limited to the number of wave-length or certain wavelength, has the advantage of being able to measure height with higher accuracy. In this paper, we propose spectroscopic method of multi-wavelength evanescent light using a Pellin-Broca prism and verify the spectral performance of the prism. This turns out to be approximately 0.25 nm/pixel.