Proceedings of JSPE Semestrial Meeting
2024 JSPE Spring Conference
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Label-free Viability Assay of Single Cell Using Deep Learning
Comparison of Models for High Accuracy Detection
*Soma ITORyoma SUZUKIShunya OKAMOTOTakayuki SHIBATAMoeto NAGAI
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 395-396

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[in Japanese]
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© 2024 The Japan Society for Precision Engineering
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