The Journal of Reliability Engineering Association of Japan
Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697
Reliability of Sub 0.1um MOS Devices and Scaling Limitation
Mitumasa Koyanagi
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1997 Volume 19 Issue 4 Pages 244-256

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© 1997 Reliability Engineering Association of Japan
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