The Journal of Reliability Engineering Association of Japan
Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697
Logic BIST Technology : Now and Future (Special Survey Approach to LSI Quality Assurance)
Xiaoqing Wen, Seiji KAJIHARA
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2004 Volume 26 Issue 4 Pages 252-262

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© 2004 Reliability Engineering Association of Japan
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