The Journal of Reliability Engineering Association of Japan
Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697
Basic Course in Semiconductor Dcvice Reliability (6) : edited. by RCJ failure physics research committee(Basic Cource in Reliability)
Koji OBINATA
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2008 Volume 30 Issue 1 Pages 77-80

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© 2008 Reliability Engineering Association of Japan
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