The Journal of Reliability Engineering Association of Japan
Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697
Evaluation of Characteristics about LSI Gate Oxide Breakdown by Simulation(<Special Survey>Testing and Evaluation Technology for LSI)
Takeshi KOYAMA, Takashi MIYAKAWA, Tsutomu ICHIKI, Tetsuo TADA, Kazutoshi MIYAMOTO
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2009 Volume 31 Issue 7 Pages 520-527

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[in Japanese]
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© 2009 Reliability Engineering Association of Japan
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