The Journal of Reliability Engineering Association of Japan

Volume 31, Issue 7

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[title in Japanese]

Article type: Cover
2009 Volume 31 Issue 7 Pages Cover1-
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_Cover1

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[title in Japanese]

Article type: Appendix
2009 Volume 31 Issue 7 Pages i-iv
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_i

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[title in Japanese]

Article type: Index
2009 Volume 31 Issue 7 Pages vii-
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_vii

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[title in Japanese]

Article type: Index
2009 Volume 31 Issue 7 Pages viii-
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_viii

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Dr. Kuroda Isao Reminded Me Sutudies' Aim of Human Factors

Yumeko MIYACHI

Article type: Article
2009 Volume 31 Issue 7 Pages 497-
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_497

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Towards Signal-Integrity-Aware LSI Testing(<Special Survey>Testing and Evaluation Technology for LSI)

Xiaoqing WEN

Article type: Article
2009 Volume 31 Issue 7 Pages 498-505
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_498

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Advanced Research for Fault Diagnosis of STARC(<Special Survey>Testing and Evaluation Technology for LSI)

Takashi AIKYO

Article type: Article
2009 Volume 31 Issue 7 Pages 506-513
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_506

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A Survey of Approaches for High Field Reliability(<Special Survey>Testing and Evaluation Technology for LSI)

Yasuo SATO, Seiji KAJIHARA

Article type: Article
2009 Volume 31 Issue 7 Pages 514-519
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_514

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Evaluation of Characteristics about LSI Gate Oxide Breakdown by Simulation(<Special Survey>Testing and Evaluation Technology for LSI)

Takeshi KOYAMA, Takashi MIYAKAWA, Tsutomu ICHIKI, Tetsuo TADA, Kazutos ...

Article type: Article
2009 Volume 31 Issue 7 Pages 520-527
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_520

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Delay Time Evaluation of Basic Logic Function Blocks(<Special Survey>Testing and Evaluation Technology for LSI)

Seiken YANO

Article type: Article
2009 Volume 31 Issue 7 Pages 528-534
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_528

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Detection of Fault Portions using CAD Navigation(<Special Survey>Testing and Evaluation Technology for LSI)

Yoshihiro NAKAJIMA

Article type: Article
2009 Volume 31 Issue 7 Pages 535-540
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_535

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Fault Diagnostic Methods for Analog Circuits in LSIs(<Special Survey>Testing and Evaluation Technology for LSI)

Norio KUJI

Article type: Article
2009 Volume 31 Issue 7 Pages 541-547
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_541

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Fault Diagnosis Method based on Device Element Level : Physical Analysis Assisted Way for Fault LSI(<Special Survey>Testing and Evaluation Technology for LSI)

Masaru SANADA

Article type: Article
2009 Volume 31 Issue 7 Pages 548-555
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_548

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Solution Business for LSI Test(<Special Survey>Testing and Evaluation Technology for LSI)

Kensuke SUZUKI

Article type: Article
2009 Volume 31 Issue 7 Pages 556-562
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_556

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[title in Japanese]

Article type: Appendix
2009 Volume 31 Issue 7 Pages 563-
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_563

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[title in Japanese]

Article type: Appendix
2009 Volume 31 Issue 7 Pages 564-
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_564_1

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[title in Japanese]

Article type: Appendix
2009 Volume 31 Issue 7 Pages 564-
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_564_2

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[title in Japanese]

Article type: Appendix
2009 Volume 31 Issue 7 Pages 564-
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_564_3

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[title in Japanese]

Article type: Cover
2009 Volume 31 Issue 7 Pages Cover2-
Published: October 01, 2009
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.31.7_Cover2

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