The Journal of Reliability Engineering Association of Japan
Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697
Fluctuation and Data Analysis in Advanced Device Development(Reliability Data Processing)
Shinji YOKOGAWA
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2009 Volume 31 Issue 8 Pages 595-602

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[in Japanese]
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© 2009 Reliability Engineering Association of Japan
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