The Journal of Reliability Engineering Association of Japan
Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697
Again, does V_<DD> Supply Current Testing Come Back as LSI Evaluation Technology?(Evaluation Technology for Electron Devise)
Masaru SANADA
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2010 Volume 32 Issue 7 Pages 498-507

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[in Japanese]
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© 2010 Reliability Engineering Association of Japan
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