The Journal of Reliability Engineering Association of Japan

Volume 32, Issue 7

Displaying 1-18 of 18 articles from this issue

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[title in Japanese]

Article type: Cover
2010Volume 32Issue 7 Pages Cover1-
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_Cover1

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[title in Japanese]

Article type: Appendix
2010Volume 32Issue 7 Pages i-
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_i

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[title in Japanese]

Article type: Index
2010Volume 32Issue 7 Pages ix-
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_ix

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[title in Japanese]

Article type: Index
2010Volume 32Issue 7 Pages x-
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_x

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Sharing Information on Reliability an Safety Problems and Building Up Their Databases for Newly Developing Countries and African Market

Kazuyuki SUZUKI

Article type: Article
2010Volume 32Issue 7 Pages 459-
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_459

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Statistical Quality Control based on Early Life Failure Rate(Evaluation Technology for Electron Devise)

Toshinari MATSUOKA

Article type: Article
2010Volume 32Issue 7 Pages 460-467
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_460

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Practical Efficiency Verification of Test Time Reduction Methods aiming at cutting Production Testing Cost(Evaluation Technology for Electron Devise)

Junichi HIRASE

Article type: Article
2010Volume 32Issue 7 Pages 468-477
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_468

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The Latest Evaluation Technology of Electronic Devices and Modules(Evaluation Technology for Electron Devise)

Yasuo IMAI

Article type: Article
2010Volume 32Issue 7 Pages 478-483
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_478

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An Introduction of Device Quality Support and Analysis Service in a Semiconductor Commercial Company(Evaluation Technology for Electron Devise)

Takemi UEKI

Article type: Article
2010Volume 32Issue 7 Pages 484-491
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_484

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A Study of Synchronous Immunity Test for PCB Level Device(Evaluation Technology for Electron Devise)

Tsuneo TSUKAGOSHI, Toshiyuki NAKAIE, Nobuchika MATSUI

Article type: Article
2010Volume 32Issue 7 Pages 492-497
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_492

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Again, does V_<DD> Supply Current Testing Come Back as LSI Evaluation Technology?(Evaluation Technology for Electron Devise)

Masaru SANADA

Article type: Article
2010Volume 32Issue 7 Pages 498-507
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_498

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Report of REAJ Kansai Branch

Toshinari MATSUOKA

Article type: Article
2010Volume 32Issue 7 Pages 508-
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_508

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[title in Japanese]

Article type: Appendix
2010Volume 32Issue 7 Pages 509-511
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_509

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[title in Japanese]

Article type: Appendix
2010Volume 32Issue 7 Pages 512-
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_512

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[title in Japanese]

Article type: Appendix
2010Volume 32Issue 7 Pages 513-
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_513_1

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[title in Japanese]

Article type: Appendix
2010Volume 32Issue 7 Pages 513-
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_513_2

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[title in Japanese]

Article type: Appendix
2010Volume 32Issue 7 Pages 513-
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_513_3

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[title in Japanese]

Article type: Cover
2010Volume 32Issue 7 Pages Cover2-
Published: November 01, 2010
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.32.7_Cover2

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